8th International "Hiroshima" Symposium on the Development and Application of Semiconductor Tracking Detectors, Taipei, Taiwan

Observation of Radiation Damage in the ATLAS Pixel System Using the High Voltage Delivery System

6 Dec 2011, 10:20

20m

Activity Center (Academia Sinica)

ORAL Pixels (including CCD's) Pixels (including CCD's)

Speaker

Sally Seidel (University of New Mexico (US))

Description

We describe the implementation of radiation damage monitoring using measurement of leakage current in the silicon pixel sensors provided by the circuits of the ATLAS Pixel Detector high voltage delivery system. The dependence of the leakage current upon the integrated luminosity for several temperature scenarios is presented. Based on the analysis we have determined the sensitivity specifications for a Current Measurement System. The status of the system and the first measurement of the radiation damage corresponding to 1.5 fb^{-1} of integrated luminosity are presented, as well as the comparison with the theoretical model. Paging and Bottom Toolbar

Presentation materials

Slides

1206_Seidel_abs_hstd08.pdf