Speakers:
Alain Delbart(Université Paris-Saclay (FR)), David Henaff(CEA), Guillaume Eurin(CEA/IRFU/DPhP), Laura Munteanu(CERN), Laura-Iuliana Munteanu(CERN)
- ERAM-46 will be tested today by Antonio. We should have a feedback from him wether or not the HV test in air is ok and if this ERAM needs a cleaning
11:05
Mesh pulsing10m
Speakers:
Alain Delbart(Université Paris-Saclay (FR)), David Henaff(CEA), Guillaume Eurin(CEA/IRFU/DPhP), Laura Munteanu(CERN), Laura-Iuliana Munteanu(CERN)
11:15
ERAM gluing5m
Speakers:
Alain Delbart(Université Paris-Saclay (FR)), Charlotte Riccio(CEA-Saclay (FR)), David Henaff(CEA), Guillaume Eurin(CEA/IRFU/DPhP), Laura-Iuliana Munteanu(CERN)
11:20
ERAM testing10m
Speakers:
Alain Delbart(Université Paris-Saclay (FR)), Charlotte Riccio(CEA-Saclay (FR)), David Henaff(CEA), Guillaume Eurin(CEA/IRFU/DPhP), Laura Munteanu(CERN), Laura-Iuliana Munteanu(CERN)
ERAM-46 cartes du mesh pulsing 8 & 9
ERAM-39 : should be scanned with FEC cards affected to ERAM-33 : fec 15 & 76
This week: scan 39 with FEC 15 & 76
11:30
ERAM AOB15m
Speakers:
Alain Delbart(Université Paris-Saclay (FR)), Charlotte Riccio(CEA-Saclay (FR)), David Henaff(CEA), Guillaume Eurin(CEA/IRFU/DPhP), Laura-Iuliana Munteanu(CERN)
Serious problem on the reliabilkity of the mesh connection to GND with the 2 pin connector + jumper
inspection of all remaining ERAMs must be done to
assess the reliability of the 2 pin connector soldering + fixing with glue
assess the quality of the contact with the jumper (glue shortening the contact length for instance)
after this survey we will decide if we bypass the connector with a wire (what will be done on 3 ERAM of the bottom TPC) on some ERAMs or all of them (the preferred and safest solution)