ERAM Meeting

Europe/Zurich
Alain Delbart (Université Paris-Saclay (FR)), David Henaff (CEA), Guillaume Eurin (CEA/IRFU/DPhP), Laura-Iuliana Munteanu (CERN)
    • 11:00 11:45
      ERAM status
      Conveners: Alain Delbart (Université Paris-Saclay (FR)), David Henaff (CEA), Guillaume Eurin (CEA/IRFU/DPhP), Laura-Iuliana Munteanu (CERN)
      • 11:00
        ERAM production status at Rui's lab 5m
        Speakers: Alain Delbart (Université Paris-Saclay (FR)), David Henaff (CEA), Guillaume Eurin (CEA/IRFU/DPhP), Laura Munteanu (CERN), Laura-Iuliana Munteanu (CERN)

        - ERAM-46 will be tested today by Antonio. We should have a feedback from him wether or not the HV test in air is ok and if this ERAM needs a cleaning

      • 11:05
        Mesh pulsing 10m
        Speakers: Alain Delbart (Université Paris-Saclay (FR)), David Henaff (CEA), Guillaume Eurin (CEA/IRFU/DPhP), Laura Munteanu (CERN), Laura-Iuliana Munteanu (CERN)
      • 11:15
        ERAM gluing 5m
        Speakers: Alain Delbart (Université Paris-Saclay (FR)), Charlotte Riccio (CEA-Saclay (FR)), David Henaff (CEA), Guillaume Eurin (CEA/IRFU/DPhP), Laura-Iuliana Munteanu (CERN)
      • 11:20
        ERAM testing 10m
        Speakers: Alain Delbart (Université Paris-Saclay (FR)), Charlotte Riccio (CEA-Saclay (FR)), David Henaff (CEA), Guillaume Eurin (CEA/IRFU/DPhP), Laura Munteanu (CERN), Laura-Iuliana Munteanu (CERN)
        • ERAM-46 cartes du mesh pulsing 8 & 9
        • ERAM-39 : should be scanned with FEC cards affected to ERAM-33 : fec 15 & 76

         

        This week: scan 39 with FEC 15 & 76

      • 11:30
        ERAM AOB 15m
        Speakers: Alain Delbart (Université Paris-Saclay (FR)), Charlotte Riccio (CEA-Saclay (FR)), David Henaff (CEA), Guillaume Eurin (CEA/IRFU/DPhP), Laura-Iuliana Munteanu (CERN)
        • Serious problem on the reliabilkity of the mesh connection to GND with the 2 pin connector + jumper
        • inspection of all remaining ERAMs must be done to
          • assess the reliability of the 2 pin connector soldering + fixing with glue
          • assess the quality of the contact with the jumper (glue shortening the contact length for instance)
          • after this survey we will decide if we bypass the connector with a wire (what will be done on 3 ERAM of the bottom TPC) on some ERAMs or all of them (the preferred and safest solution)
        •