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AI-assisted development of failure prediction algorithms for analog electronics applied to the CROME system

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24/1-016 - HSE Unit Head Meeting Room (CERN)

24/1-016 - HSE Unit Head Meeting Room

CERN

14
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    • 10:00 → 11:00
      AI-assisted development of failure prediction algorithms for analog electronics applied to the CROME system 1h
      Speaker: Felix Johannes Waldhauser (Universitaet Stuttgart (DE))
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