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3:10 PM
CMOS simulation and connection between device-level and electronics simulations
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3:25 PM
Other detectors/technologies/activities
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3:40 PM
Newly measured semiconductor properties
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Jürgen Burin
(Austrian Academy of Sciences (AT))
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3:55 PM
Radiation damage: validation with measurements and development of high-fluence models
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4:10 PM
Time dependent electric/weighting field
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4:25 PM
Simulation tools development