2–6 Jun 2025
Nikhef, Amsterdam
Europe/Amsterdam timezone

Environmental Stress Tests on (AC-coupled) Low Gain Avalanche Diodes

4 Jun 2025, 14:40
15m
Nikhef, Amsterdam

Nikhef, Amsterdam

WG2 - Hybrid silicon sensors WG2/WP2 - Hybrid Silicon Technologies

Speaker

Trevor Russell (Brown University (US))

Description

Low Gain Avalanche Diodes (LGADs) are a significant improvement upon standard silicon sensors because the gain layer provides timing resolution on the scale necessary to lend usage in environments such as the Large Hadron Collider (LHC) and accordingly form the backbone of timing layers present in the CMS and ATLAS phase 2 upgrades at the LHC. AC-coupled LGADs (AC-LGADs) allow charge sharing between electrodes to achieve improved spatial resolution per readout channel compared to standard LGADs, enabling a near-100% fill factor and providing micrometer-level spatial resolution.. The response of LGAD and AC-LGAD performance and electrical characteristics to environmental conditions such as temperature and humidity are vital to study as LGADs and AC-LGADs are to be operated in extreme environments such as the HL-LHC, FCC, fixed target experiments, and in outer space. LGADs and AC-LGADs fabricated at Brookhaven National Laboratory (BNL) are stress-tested at the BNL Silicon Laboratory, DRD3 laboratory at CERN, and Brown university by repeatedly cycling the temperature between -60C and 120C and applying a bias voltage until breakdown is observed. The data is analyzed to extract the breakdown voltage as a function of temperature. IV-scans are also performed at a wide range of humidities in order to examine any potential dependence.

Type of presentation (in-person/online) online presentation (zoom)
Type of presentation (I. scientific results or II. project proposal) I. Presentation on scientific results

Authors

Gaetano Barone (Brown University) Trevor Russell (Brown University (US))

Presentation materials