3rd DRD3 week on Solid State Detectors R&D

Session

WG5 - Characterization techniques, facilities

6 Jun 2025, 08:30

Nikhef, Amsterdam

83. Introduction and news

Bojan Hiti (Jozef Stefan Institute (SI)), Prof. Ivan Vila Alvarez (Instituto de Física de Cantabria (CSIC-UC))

06/06/2025, 08:30

WG5 - Characterization techniques - facilities

30. Advancements and future expansions of the Caribou DAQ system

Ilias Kamoisis (CERN and Aristotle University of Thessaloniki (GR))

06/06/2025, 08:45

WG5 - Characterization techniques - facilities

Caribou is a versatile data acquisition system used in multiple collaborative frameworks (CERN EP R&D, DRD3, AIDAinnova, Tangerine) for laboratory and test-beam qualification of novel silicon pixel detector prototypes. The system is built around a common hardware, firmware and software stack shared across different projects, thereby drastically reducing the development effort and cost. It...

59. Running Your Test Beam with Constellation

Stephan Lachnit (Deutsches Elektronen-Synchrotron (DE))

06/06/2025, 09:05

WG5 - Characterization techniques - facilities

The qualification of new detectors in test beam environments presents a challenging setting that requires stable operation of diverse devices, often employing multiple data acquisition (DAQ) systems running on several machines in a local network. Changes to these setups are frequent, such as using different reference detectors depending on the facility. Managing this complexity necessitates a...

13. High Bandwidth Readout Electronics for TCT in Thin Detectors

Andreas Gsponer (Austrian Academy of Sciences (AT))

06/06/2025, 09:25

WG5 - Characterization techniques - facilities

The transient current technique (TCT) has been a workhorse of detector characterization, allowing for the extraction of drift velocities, electric fields, space charge densities, and more. However, for very thin detectors ($\leq 50$ μm), the currently available readout electronics start to run into bandwidth limitations, as the charge carrier drift time becomes of the same order of magnitude...

36. Double Beam TCT (DB-TCT): new laser method for high rate sensor tests

Bojan Hiti (Jozef Stefan Institute (SI))

06/06/2025, 09:45

WG5 - Characterization techniques - facilities

4d tracking detectors for future experiments based on Resistive Silicon Detector technology will be exposed to high channel occupancy due to targeted low density of readout channels. To study the detector response to two nearly concurrent hits, we developed a new Transient Current Technique method (Double Beam TCT), where two focused pulsed laser beams can be controlled independently in space...

87. Discussion

06/06/2025, 10:05