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This paper presents the results of an experimental study on the effect of a temperature gradient on the characteristics of asymmetric X-ray reflection in quartz single crystals (X-cut) in the Laue geometry.
The presence of a temperature gradient induces bending of the atomic planes and a change in the interplanar spacing across the thickness of the crystal, which in turn affects the parameters of the reflected beam. To analyze the focusing behavior, X-ray films were used to obtain topographs of the cross-sections of the reflected beam at three different distances.
The change in the relative intensity of the diffracted X-ray beam was measured, and the focal length was calculated at different values of the temperature gradient.
As a result of the conducted experimental studies, it was established that with an increase in the temperature gradient, the intensity of the reflected X-ray beam significantly increases, and the focal point shifts closer to the crystal.
