Speaker
Vardan Margaryan
(Institute of Applied Problems of Physics NAS RA)
Description
An experimental investigation of double-slit dynamic X-ray diffraction in silicon crystals demonstrates that Young’s interference fringes can be formed in the cross section of the reflected beam, depending on the distances between the monochromator and the slits, as well as between the slits themselves. The study reveals that the number of observable fringes is influenced by both the crystal thickness and the Bragg reflection order. This diffraction method offers potential applications for determining the refractive index of materials by measuring fringe displacement relative to the beam center, as well as for addressing other interference phenomena in the X-ray wavelength range.
Authors
Vahan Kocharyan
(Institute of Applied Problems of Physics of NAS RA)
Serob Noreyan
(IAPP NAS RA)
Vardan Margaryan
(Institute of Applied Problems of Physics NAS RA)
Vigen Aghabekyan
(IAPP NAS RA)
Mesrop Mesropyan
Arusyak Mamyan
Artur Movsisyan
(I)
