Speaker
Description
This presentation will provide an overview about Broadcom’s SiPM and photodetection technologies including NIR and NUV-SiPM. Focus will be put on the initial results of the newly developed NUV-DJ SiPM technology, showing a significant increase of the PDE above 420nm compared to the NUV-MT technology, while excellent NUV-sensitivity from 420nm down to 250nm is maintained. At 500nm the PDE was improved from 52% to 65% while keeping the a high dynamic range by a SPAD pitch of 40µm and an overall reduced contribution of correlated noise.
The high PDE combined with low noise are key to best-in-class performance in CTR for LYSO-based TOF-PET and extends the application range to other green emitting scintillators like GaGG and enables BGO based Chrerenkov TOF-PET. Results of the initial characterization of NUV-DJ will be summarized and presented.
Additionally, an overall outlook including the development of a 3x3mm2 HDR-NUV-MT SiPM with SPAD pitch smaller than 20µm and a TEC-package targeting applications requiring high dynamic range or extremely low dark count rates will be presented.
Broadcom’s NUV SiPMs find application in TOF-PET, Cherenkov-PET, radiation spectroscopy, photon-counting X-ray detection & PCCT, flow cytometry, and time-gated fluorescence.
Keywords: TOF-PET, Cherenkov, radiation spectroscopy, PCCT, Fluorescence Detection
| Track | TBPET |
|---|---|
| Presentation type | Oral |