|
08:30
|
Refreshment and registration
|
|
09:00
|
Introduction
(until 09:35)
|
|
09:00
|
Welcome and Introduction
-
Ennio Capria
(ESRF)
|
|
09:05
|
Welcome from ENEA
-
Giuseppe Celentano
(ENEA)
|
|
09:20
|
Welcome from RADNEXT
-
Ruben Garcia Alia
(CERN)
|
|
09:35
|
Session 1: Irradiation Facilities in Europe
(until 11:05)
|
|
09:35
|
Session Chair Introduction
-
Yolanda Morilla
(University of Seville)
|
|
09:40
|
Overview on irradiation facilities within RADNEXT 2030
-
Gerd Luis Datzmann
(Datzmann interact & innovate)
|
|
10:05
|
Database of irradiation facilities: Extension to industry-related information
-
José De Martín Hernández
(CNA)
|
|
10:20
|
Co‑60 TID Irradiation Testing Intercomparisons: Review of Previous Campaigns and Outlook for an Extended Exercise
-
Alessandra Costantino
(ESA/ESTEC)
|
|
10:40
|
ISO/IEC 17025 in Practice: Ensuring Quality in Radiation Testing
-
Christoph Tscherne
(Seibersdorf Laboratories)
|
|
10:50
|
Discussion with audience
|
|
11:05
|
--- Facility Poster Session & Coffee Break ---
|
|
11:35
|
Session 2: From Industry to Industry
(until 12:50)
|
|
11:35
|
Session Chair Introduction
-
Francesco Pintacuda
(STMicroelectronics)
Philipp Bender
(Infineon)
|
|
11:40
|
ESCC system & The Radiation Working Group
-
Renaud Mangeret
(Airbus Defence & Space)
|
|
11:50
|
On Single-Event Effects Sensitivity Characterization of Modern FinFET technologies
-
Maxim Gorbunov
(IMEC)
|
|
12:10
|
CR robustness testing of power semiconductor devices and requirements on test facilities
-
Christian Felgemacher
(ROHM)
|
|
12:30
|
Discussion with audience
|