20–24 Jul 2026
Europe/Zurich timezone

Progress on the MALTA CMOS Sensor: Edge-TCT Measurements for Parametric Pixel Simulation

21 Jul 2026, 18:02
1m

Speaker

Lucian Fasselt (DESY)

Description

MALTA2 is a monolithic active pixel sensor, developed in 180 nm CMOS technology for radiation-hard applications in high-rate environments. This contribution summarizes recent progress on the MALTA2 sensor characterization and simulation developments. Test-beam measurements at the CERN SPS are used to study hit efficiency, charge collection, and timing performance before and after irradiation up to $5\times10^{15} \mathrm{n_{eq}/cm^{2}}$.

In addition, Edge-TCT measurements of the MALTA2 sensor on epitaxial silicon have been performed using both analog and digital readout. The front-end time-walk is characterized with dedicated analog monitoring pixels. For the first time, the charge collection is studied through digital Edge-TCT, reconstructing charge solely from binary hit data. The digital readout gives access to the full edge of the pixel matrix instead of just the monitoring pixels. Combined with test-beam measurements, these studies result in a 3D pixel parameterization of the charge collection.

The measured sensor response serves as input to a fast parametric pixel simulation developed for chip design optimization and system-level studies. Applications of the resulting simulation model to MALTA2 detector studies are discussed.

Author

Co-authors

Carlos Solans Sanchez (CERN) Dumitru-Vlad Berlea (Deutsches Elektronen-Synchrotron (DE)) Milou Van Rijnbach (CERN) Steven Worm (Deutsches Elektronen-Synchrotron (DE))

Presentation materials