20–24 Jul 2026
Europe/Zurich timezone

Electrical simulation and S-parameter measurements of all-silicon CMOS monolithic pixel modules

21 Jul 2026, 17:53
1m

Speaker

Darshil Girishbhai Vagadiya (Universitaet Siegen (DE))

Description

Silicon pixel detectors offer high spatial and temporal resolution with a low material budget. Traditional multi-chip modules add material through bump-bonding, flexible PCBs, cooling, and support structures. A new approach explores post-processing monolithic wafers with redistribution layers interconnecting multiple chips, enabling thin and lightweight structures based on low-power monolithic CMOS sensors. A current concept used in all-silicon modules foresees four future-generation monolithic active pixel sensors (MAPS) in a row, which reduces component count and supports low-material designs suitable for future collider environments. The research focuses on the electrical performance of the signal and data interconnections at high transmission speeds. Current structures target the first use-cases, lower speeds up to 320 Mbps, but want to push as much as possible to at least 1 Gbps, more if possible. Prototype measurements covering impedance, signal integrity, S-parameters, and electrical simulations of differential trace geometry, dielectric layers, and vias are used to optimize the design for higher data-rate operation.

Author

Darshil Girishbhai Vagadiya (Universitaet Siegen (DE))

Co-authors

Andreas Ulm (University of Bonn) Arnulf Quadt (Georg August Universitaet Goettingen (DE)) Denise Muller (Universitaet Siegen (DE)) Hans Krueger (University of Bonn) Jochen Christian Dingfelder (University of Bonn (DE)) Joern Grosse-Knetter (Georg August Universitaet Goettingen (DE)) Marco Vogt (University of Bonn (DE)) Markus Cristinziani (Universitaet Siegen (DE)) Michael Ziolkowski (Universitaet Siegen) Nana Chychkalo (Georg August Universitaet Goettingen (DE)) Qader Dorosti Hasankiadeh (Universitaet Siegen (DE))

Presentation materials