Speaker
Koji YOSHIMURA
(High Energy Accelerator Research Organization (KEK))
Description
Measurement of PPD (Pixelated Photon Detector) characteristics with various wavelengths is important for understanding and improvement of the sensor performances. We have developed a new pulsed laser microscope system whose wavelength is continuously tunable from 410 nm to 2200 nm by using OPO laser system. Laser spot can be focused to ~2 um, small enough to measure pixel-by-pixel performance of PPD. In this workshop, new multi-wavelength measurements of various types of PPDs using the laser microscope system will be reported.
Author
Koji YOSHIMURA
(High Energy Accelerator Research Organization (KEK))
Co-author
Isamu Nakamura
(Department of Physics)
