21–28 Jun 2026
Yerevan & Jermuk
Asia/Yerevan timezone

Session

Lectures & Reports at IAPP

LR24/6-2
24 Jun 2026, 11:40
Yerevan & Jermuk

Yerevan & Jermuk

IAPP NAS RA - Yerevan, Armenia

Presentation materials

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  1. Prof. Giuseppe Dattoli (ENEA-Frascati Fusion Department (Retired))
    24/06/2026, 11:40

    Analytical and semi-analytical models of free-electron laser (FEL) dynamics have long provided valuable physical insight and practical tools for the design of self-amplified spontaneous emission and oscillator configurations. Logistic-type growth models and formulations based on Jacobi elliptic functions successfully capture the evolution from the small-signal regime to the onset of...

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  2. Yaroslav Kolesnikov (Budker Institute of Nuclear Physics)
    24/06/2026, 12:30

    Accelerator based neutron source was proposed, developed and now is intensively using for boron-neutron capture therapy (BNCT), – binary method for the treatment of malignant tumors, and BNCT research related topics, such as testing boron agents for BNCT and developing and implementing methods for dosimetry in BNCT.
    Nowadays, important task in BNCT is to provide a methodology for direct...

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  3. Vladislav Borin (Budker INP)
    24/06/2026, 12:50

    We present an overview of recent and upcoming enhancements to the optical electron beam diagnostics stations at the Novosibirsk Free Electron Laser (FEL) facility. These diagnostic stations are designed to measure key beam parameters, including beam energy spread, length and emittance, at the third FEL of Novosibirsk FEL. Currently, the stations for measuring electron beam energy spread and...

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  4. Iurii Shablov (NRC "Kurchatov Institute")
    24/06/2026, 13:10

    Single-crystal silicon and silicon dioxide remain the primary materials for high-precision mirrors and other components of X-ray and extreme ultraviolet (EUV) optics. A key feature of these elements is the stringent requirement to maintain their complex geometrical shape and high surface smoothness. One of the approaches to reducing surface roughness and shaping substrates for various X-ray...

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