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15:10
CMOS simulation and connection between device-level and electronics simulations
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Jona Dilg
(University of Zurich (CH))
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15:25
Other detectors/technologies/activities
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15:40
Newly measured semiconductor properties
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15:55
Radiation damage: validation with measurements and development of high-fluence models
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16:10
Time dependent electric/weighting field
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16:25
Simulation tools development