Speaker
Josh Alex David Curry
(University of Liverpool (GB))
Description
The performance of the silicon detectors used in the ISOLDE Solenoidal Spectrometer depends on an accurate calibration, which requires precise knowledge of these detector dead-layer thicknesses. A mixed alpha source was used to irradiate the ISS silicon array at different incidence angles. Source positions were determined by fitting the measured count distributions with a solid-angle model. By relating the uncalibrated ADC response to the particle entrance angle, detector gain, offset, and dead-layer thickness can be extracted simultaneously. This method has been applied across the full array, providing the first dead-layer measurement for all silicon detector wafers and improving the accuracy of future spectroscopy experiments at ISS.
Author
Josh Alex David Curry
(University of Liverpool (GB))
Co-author
Dr
Liam Gaffney
(University of Liverpool)