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09:00
Simulation of Double Junction in Irradiated Detectors Using Silvaco TCAD
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Maria Golovleva
(Lappeenranta Univ. of Technology)
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09:20
Simulation of CV, TCT and CCE with an effective 2-defect model (moved to Wednesday)
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Robert Eber
(KIT - Karlsruhe Institute of Technology (DE))
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09:25
p-n-n+ diode CV characteristics changes at various contract and body doping concentrations. TCAD simulations
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Juozas Vaitkus
(Vilnius University (LT))
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09:40
Simulations of edge-TCT and 2-defect model CCE
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Timo Hannu Tapani Peltola
(Helsinki Institute of Physics (FI))
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10:30
Simulation and Technology developments of Low Gain Avalanche Detectors (LGAD) for High Energy Physics applications
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Salvador Hidalgo
(Centro Nacional de Microelectrónica (IMB-CNM-CSIC))
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10:45
Red TCT measurements of Low Gain Avalanche Diodes (LGAD) produced at CNM-Barcelona
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Marcos Fernandez Garcia
(Universidad de Cantabria (ES))
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11:00
Simulation of Gain-Optimized Sensors
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Colin Parker
(University of California, Santa Cruz (US))
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11:20
Pulse shapes of alpha particles in CNM diodes with and without gain
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Scott Ely
(SCIPP)
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11:40
Studies of CNM diodes with gain
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Gregor Kramberger
(Jozef Stefan Institute (SI))
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12:00
Combined Measurement Results of dedicated RD50 Charge Multiplication Sensors
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Sven Wonsak
(University of Liverpool (GB))
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12:20
Ultra-Fast Silicon Sensors based on Charge Multiplication, an Update
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Hartmut Sadrozinski
(SCIPP, UC santa Cruz)