Topical review talks: Review of microelectronics and detectors
Convener:
DrErik Heijne(Fellow IEEE, CERN PH Department, also at IEAP of Czech Technical University Prague, Czech Republic and NIKHEF, Amsterdam, Netherlands)
slides
09:45
→
10:30
Topical review talks: Molecular imaging
Convener:
DrJulia Jungmann(Paul Scherrer Institute, Villigen, Switzerland, formerly at AMOLF, Amsterdam, Netherlands)
slides
10:30
→
11:15
Topical review talks: PET technique and applications
Convener:
Prof.Dr. Alberto Del Guerra(University of Pisa, Italy)
slides
11:15
→
11:30
Coffee break
15m
11:30
→
12:15
Topical review talks: Development of Silicon Drift Detectors and recent applications
Convener:
Prof.Chiara Guazzoni(Politecnico di Milano and INFN Milano, Italy)
slides
12:15
→
12:30
Presentation by Industries: New high throughput, large area Silicon Drift Detectors
Convener:
DrJuergen Knobloch(KETEK GmbH, Germany)
slides
12:30
→
14:00
Lunch
1h 30m
14:00
→
14:15
Presentations by Industries: New Silicon Photomultipliers with very high proton detection efficiency
Convener:
Werner Hartinger(KETEK GmbH, Germany)
slides
14:15
→
14:30
Presentation by Industries: PIXIRAD: a new X-Ray imaging system based on chromatic photon counting technology