EPS - Technology and Innovation Group - Advanced Radiation Detectors for Industrial Use

Session

Topical review talks

Nov 12, 2013, 9:00 AM

Sala ''Nullo Baldini'' (Ravenna, Italy)

Conveners

Topical review talks: Review of microelectronics and detectors

• Erik Heijne (Fellow IEEE, CERN PH Department, also at IEAP of Czech Technical University Prague, Czech Republic and NIKHEF, Amsterdam, Netherlands)

Presentation materials

slides

Dr. Erik Heijne