Speaker
Iouri Musienko
(Northeastern University)
Description
Results on the radiation hardness of multipixel Geiger-mode avalanche
photodiodes (G-APDs) are presented. Recently-developed G-APDs from three
manufacturers (Hamamatsu (Japan), CPTA(Russia) and Mikron/
Dubna(Russia)) were exposed to 28 MeV positrons with fluences up to 8 · 10
10 positrons/cm2 at the Paul Scherrer Institute. The effects of this radiation
on many G-APD parameters such as gain, photon detection efficiency, dark
current, noise and dark count rate are shown and discussed.
Primary author
Iouri Musienko
(Northeastern University)
