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09:00
RF breakdown and pulsed surface heating tests of different materials
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Jay L Hirshfield
(Yale University & Omega-P, Inc.)
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09:30
Electron microscopy analyses of CLIC Study structures exposed to RF
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Gonzalo Arnau Izquierdo
(CERN)
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10:00
rf acquisition system for CLIC high Gradient testing
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Raquel Fandos
(Unknown)