Speaker
Clara Nellist
(LAL-Orsay (FR))
Description
It is known that for the current design of planar pixel sensors, there is a drop of efficiency at the punch-through structure of the biasing system at the edge of pixels. Various geometries, as part of the ATLAS Inner Tracker (ITK) upgrade, are being investigated to reduce this inefficiency.
A planar pixel sensor with multiple alternative bias rail geometries has been tested at the SPS beam test facility at CERN in late 2014. Measurements were taken with the FE-I4 beam telescope and results from the beam test are presented, focusing on the efficiency within the pixel. Future plans for further investigations are also discussed.
Author
Clara Nellist
(LAL-Orsay (FR))
Co-authors
Abdenour Lounis
(Laboratoire de l'Accelerateur Lineaire (FR))
Vagelis Gkougkousis
(Laboratoire de l'Accelerateur Lineaire (FR))
