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EUV and X-ray polarization radiation as a perspective instrument for submicron beam diagnostics

9 Sept 2015, 10:00
30m
Invited 4. Diffraction Radiation, Smith-Purcell Effect 4. Diffraction Radiation, Smith-Purcell Effect

Speaker

Alexey Tishchenko (National Research Nuclear University (MEPhI))

Description

Polarization radiation arises when a moving charge acts upon matter by its Coulomb field, and the matter polarized by this dynamically changing field becomes a source of radiation. The charged particle itself can move uniformly and nevertheless generate electromagnetic radiation: widely known Cherenkov and Transition radiations, Diffraction radiation (DR), Smith-Purcell radiation (SPR), Parametric X-ray radiation. Polarization-type interaction of particles with matter can be a good source of electromagnetic radiation, including Free Electron Lasers based on SPR, but is especially useful for beam diagnostics. In this report we shall discuss basic features of these types of radiation in EUV and X-ray range as a prospective instrument for submicron beam diagnostics. We also discuss the possibility of using X-ray backward TR, PXR from multilayered structures, X-ray CR near the absorption lines, and their distinctive features for attosecond electron bunches. At last, we discuss DR and SPR in EUV/X-ray region: possibility for diagnostics of bunch length with help of coherent radiation and beam size with help of incoherent radiation, including incoherent form-factor. Along with it we also mention what was made in theory and which problems have not been solved yet.

Primary author

Alexey Tishchenko (National Research Nuclear University (MEPhI))

Co-authors

Daria Sergeeva (National Research Nuclear University (MEPhI)) Prof. Mikhail Strikhanov (National Research Nuclear University “MEPhI”, Moscow, Russia)

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