Radiation from Relativistic Electrons in Periodic Structures "RREPS-15"

The thermal stress at short electron bunches passage through a thin target

7 Sept 2015, 16:30

2h

Poster 7. Processes with Crystalline Targets Poster Section

Speaker

Anton Babaev

Description

The thin target could be used for beam diagnostics by means the radiation that is induced by interaction of beam particles with target matter [1-3]. The electron beams used in modern applications (as, for example, modern FEL-s) have very large brightness, small emittance as well as very short bunch length. For example, the bunch length of XFEL is about of 25 um at bunch charge 1 nC and with electrons energy of 17 GeV [4]. The passage of this powerful short bunches could damage the target or even completely destroy it. In the presented work both the heating when the train of such bunches passages through the target and the corresponding thermal stress are investigated. It is shown the target works in extreme regime close to phase transition temperatures and stress limits. The model to investigate these extreme regimes is developed. The work was supported by the grant #3761 of Ministry of Education and Science of the Russian Federation within “Nauka” Program. [1] A.S. Gogolev et al., J. Phys. Conference Series 357 (2011) 012018 [2] L.G. Sukhikh et al., J. Phys. Conference Series 236 (2010) 012011 [3] Y. Takabayashi Phys. Lett. A 376 (2012) 2408–2412 [4] M. Altarelli et al. (eds), XFEL: The European X-Ray Free Electron Laser, Technical design report no. DESY 2006-097 (DESY, 2006).