Radiation damage in semiconducting devices, calorimeters and electronics

by S.J. Watts (Brunel University, Uxbridge, UK)

Wednesday 2 Feb 2000, 11:00 → 14:00 Europe/Zurich

500/1-001 - Main Auditorium (CERN)

Lecture 3 Detector systems at the LHC will have to survive a harsh radiation environment. These lectures will explain the underlying physical basis to radiation effects in various detector systems and associated electronics. Four key issues will be discussed: how to relate microscopic damage with macroscopic observations, prediction strategy for a detector system in a known radiation environment with worked examples, radiation testing and monitoring, outlook for silicon in extreme radiation environments.