The manufacturing and test folder (MTF): description and examples of application to the LHC

by Sonia Mallon-Amerigo and Elena Manola-Poggioli

Thursday 7 Nov 2002, 14:15 → 15:15 Europe/Zurich

LHC Auditorium (CERN)

The MTF application is an integrated part of the Engineering Data Management System (EDMS) at CERN and was developed to capture manufacturing and test data for the LHC project. The basic requirement is to provide traceability for large quantities of complex parts manufactured in many different places and countries.This implies that a wide range of data, such as information about the manufacturer, the manufacturing procedures, test results, non-conformity reports and related documentation, must be stored and retrieved from data repositories around the world. As of about one year ago, the MTF application is in production and manages already an impressive amount of vital technical information about the LHC equipment. This seminar will present the MTF application and describe its practical use at the LHC.