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Other Seminars
OTHER SEMINARS - 5TH RD49 AND COTS WORKSHOP <BR>SEE effects sessionRadiation tolerant DSM ASICs session
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Europe/Zurich
13-2- (CERN)
13-2-
CERN
Description
SEE effects session
09:00 P. Jarron - Introduction
09:05 M. Hollreisen, ESA-ESTEC Microelectronics group - Overview of
ESA-ESTEC microelectronics R&D and ASICs development
09:35 A. Paccagnella, University of Padova - Gate rupture of ultra thin gate oxide in DSM technologies
09:55 G. Berger, Université de Louvain la Neuve - SEE test facility with the CYCLONE facility
10:15 Coffee Break
10:35 R. Velazco, T. Calin, TIMA Grenoble - Design techniques for SEU-robust digital CMOS circuits
10:55 M. Huhtinen, CERN CMS - Upset rate calculation for the LHC
environment
11:15 I. Wilhem, Prague - Study of neutron induced SEU with
energy spectrometry measurement
11:30 M.L Andrieux, IN2P3 Grenoble - Neutron induced SEU in Glink link
11:45 R. Yarema, FNAL - SEU measurements on the SVX3 built in the
Honeywell 0.8 CMOS process
12:00 A. Marchioro, CERN MIC group - SEU hardened dual port 2 kbytes
SRAM in 0.25 micron technology
12:15 F. Faccio, CERN MIC group - SEU measurement of 0.25micron
radiation tolerant digital circuit
12:30 J. Fulcher, Imperial College - SEU measurements on the APV6 chip
12:50 - End of the SEU session
Radiation tolerant DSM ASICs session
14:00 J. Gasiot, L. Dusseau, Montpellier - Dosimeter based on optically stimulated and luminescent films
14:20 B. Demey, IMEC Belgium - Availability of DSM technology at IMEC,
overview of 0.18 micron digital library development plans with ESA
14:40 M. French, Rutherford lab - APV25 in 0.25 micron radiation tolerant CMOS for the CMS tracker readout
15:00 R. Yarema, FNAL - First result with radiation tolerant circuit in TSMC 0.25 micron CMOS process
15:15 P. Moreira, CERN MIC group - High-speed serializer for LHC optical links in radiation tolerant 0.25 micron CMOS technology
15:35 G. Anelli, CERN MIC group - large dynamic range analogue memory
in 0.25 micron radiation tolerant CMOS design
15:55 W. Dulinski, LEPSI, Strasbourg - First preliminary results on
monolithic pixel detector compatible with CMOS process
16:10 Coffee break
16:30 K. Kloukinas, CERN MIC group - Digital standard cells library in
0.25 micron CMOS for radiation tolerant circuit design
16:50 A. Rivetti, CERN MIC and INFN Torino - Multiple low-power ADC
in 0.25 micron rad tool CMOS
17:10 Panel session on radiation tolerant ASICs
17:30 end
Organiser(s): Pierre Jarron/EP Division
Organiser(s): Pierre Jarron/EP Division