2nd TCT Workshop

Name: 2nd TCT Workshop
Start: 2016-10-17T09:25:00+02:00
End: 2016-10-18T14:40:00+02:00
Location: Jožef Stefan Institute

17 Oct 2016, 09:25 → 18 Oct 2016, 14:40 Europe/Zurich

Main Lecture Hall (Jožef Stefan Institute)

Main Lecture Hall

Jožef Stefan Institute

Jamova 39 SI-1000 Ljubljana

Description

This is the second workshop on Transient Current Technique, with the first one being held at DESY in 2015 ( https://indico.desy.de/conferenceDisplay.py?confId=12934 ). Transient Current Technique is becoming one of the key techniques in sensor characterization and qualification and has gained a lot of users in recent years. With Two Photon Absorption TCT on the horizon, the future of TCT certainly remains bright. The workshop is dedicated to the exchange of information and experience in TCT. It covers all the aspects of operation: -experimental equipment -operational experiences -analysis software and ways to extract different sensor information from measurements -simulation of measurements A speciality of the workshop is the laboratory exercise part where hands-on experience can be gained. The second workshop has extended the topic also to the most recent findings obtained from TCT measurements on different devices. Oganizing committee Vladimir Cindro , Jožef Stefan Institute Hendrik Jansen , DESY Andrej Gorišek, Jožef Stefan Institute Gregor Kramberger, Jožef Stefan Institute Susanne Kühn, Unviersity of Freiburg & CERN Igor Mandić, Jožef Stefan Institute Marko Mikuž, Jožef Stefan Institute & University of Ljubljana Sven Wonsak, University of Liverpool Marko Zavrtanik, Jožef Stefan Institute

Participants

28 View full list

Monday 17 October
- Mon 17 Oct
- Tue 18 Oct
- 09:25 → 09:55
  
  Registration 30m Main Lecture Hall
  
  Main Lecture Hall
  
  Jožef Stefan Institute
  
  Jamova 39 SI-1000 Ljubljana
- 09:55 → 10:00
  
  Welcome 5m Main Lecture Hall
  
  Main Lecture Hall
  
  Jožef Stefan Institute
  
  Jamova 39 SI-1000 Ljubljana
  
  Welcome.pdf
  
  Welcome.pptx
- 10:00 → 11:00
  TCT systems Main Lecture Hall
  
  Main Lecture Hall
  
  Jožef Stefan Institute
  
  Jamova 39 SI-1000 Ljubljana
  
  Update on present and future TCT systems
  - 10:00
    
    Advanced TCT systems 30m
    
    Speaker: Marko Zavrtanik (Jozef Stefan Institute (SI))
    
    2TCT-MZ.pptx
  - 10:30
    
    Two photon absortion Transient Current Technique System 30m
    
    Speaker: Marcos Fernandez Garcia (Universidad de Cantabria (ES))
    
    TPA-TCT_2ndTCTWkshp_Ljubljana_MarcosFernandez_Oct2016.pdf
- 11:00 → 11:20
  
  Coffee break 20m Main Lecture Hall
  
  Main Lecture Hall
  
  Jožef Stefan Institute
  
  Jamova 39 SI-1000 Ljubljana
- 11:20 → 12:20
  New ways of using TCT Main Lecture Hall
  
  Main Lecture Hall
  
  Jožef Stefan Institute
  
  Jamova 39 SI-1000 Ljubljana
  
  Timing, Single Event Upset, Defect investigation
  - 11:20
    
    Laboratory results on LGADs (Timming) 20m
    
    Speaker: Marco Ferrero (Universita e INFN Torino (IT))
    
    Laboratory Results on LGADs.pdf
  - 11:40
    
    TCT in presence of continuos illumination - studies of bulk material 20m
    
    Speaker: Gregor Kramberger (Jozef Stefan Institute (SI))
    
    TCT in presence of CW (DC).pdf
    
    TCT in presence of CW (DC).pptx
  - 12:00
    
    Resolving authentic time dependence of time-of-flight photocurrent in organic semiconductors 20m
    
    Time-of-flight photoconductivity (TOF) is a powerful method, which is used to study conversion of photons to electrons and their transport through thin organic semiconductor layers. Compared to current-voltage characterization methods, TOF results are unaffected by the spurious effects at the semiconductor/metal interfaces. Precise knowledge of photocurrent time-dependence is of crucial importance for the determination of charge transport parameters such as mobility and the width of charge transporting states. Our TOF measurements of single-crystals of dioctyl-benzothieno-benzothiophene (C8-BTBT) show that transport of photexcited carriers and the corresponding photocurrent across two coplanar metal contacts separated by 120 µm, occurs in a fraction of a microsecond. However, measured time-dependent photocurrent (I(t)), compared to theoretical predictions, showed additional peaks and significant broadening of the I(t) lineshape. We found that additional peaks correspond to signal reflections from the waveguide terminations. And peaks broadening occurs due to 3-ns duration of the photoexcitation laser. Direct deconvolution of the measured signal was not possible due to signal reflections and relatively high noise-to-signal ratio. Therefore we estimated a time dependence of the photocurrent, which reproduced the measured signal transient. Estimated I(t) was considered as an authentic TOF response of the material under investigation.
    
    Speaker: Egon Pavlica (University of Nova Gorica)
    
    pavlicaTCT.pdf
    
    pavlicaTCT.pdf
    
    pavlicaTCT.pptx
- 12:20 → 13:10
  Practical issues(tips and tricks) Main Lecture Hall
  
  Main Lecture Hall
  
  Jožef Stefan Institute
  
  Jamova 39 SI-1000 Ljubljana
  
  Practical information on differnt difficulties experienced during operation
  - 12:20
    
    Understanding pulse shapes at high fluences 20m
    
    Speaker: Marko Mikuz (Jozef Stefan Institute (SI))
    
    TCT-Oct16.pdf
  - 12:40
    
    TCT pulse anaysis and corrections 20m
    
    Speaker: Gregor Kramberger (Jozef Stefan Institute (SI))
    
    Analysis of the pulse taken with TCT.pdf
    
    Analysis of the pulse taken with TCT.pptx
  - 13:00
    
    Beam locator/Beam monitoring/Support PCBs 10m
    
    Speakers: Gregor Kramberger (Jozef Stefan Institute (SI)), Sven Wonsak (University of Liverpool (GB))
    
    TipsAndTricks_Particulars.pdf
    
    TipsAndTricks_Particulars.pptx
- 13:10 → 15:00
  
  Lunch Break 1h 50m Za pumpo
  
  Za pumpo
- 15:00 → 16:00
  
  Hands on experience JSI Labs
  
  JSI Labs
  
  Visiting the labs.
- 16:00 → 16:40
  Results from recent TCT measurements on different detector structures Main Lecture Hall
  
  Main Lecture Hall
  
  Jožef Stefan Institute
  
  Jamova 39 SI-1000 Ljubljana
  - 16:00
    
    Edge TCT on AMS H35 HV-CMOS devices 20m
    
    Speaker: Emanuele Cavallaro (IFAE - Barcelona (ES))
    
    Cavallaro_2ndTCTworkshop.pdf
  - 16:20
    
    Edge-TCT measurements on different HVCMOS devices 20m
    
    Speaker: Bojan Hiti (Jozef Stefan Institute (SI))
    
    20161017-hiti_1.pdf
    
    20161017-hiti_1.pptx
- 16:40 → 17:40
  
  Wine tasting 1h Main Lecture Hall
  
  Main Lecture Hall
  
  Jožef Stefan Institute
  
  Jamova 39 SI-1000 Ljubljana
- 20:00 → 00:00
  
  Workshop dinner 4h Pivnica Union -- Pivovarniška ulica 2, 1000 Ljubljana
  
  Pivnica Union -- Pivovarniška ulica 2, 1000 Ljubljana
  
  https://www.google.com/maps/place/Pivnica+Union/@46.059731,14.498712,15z/data=!4m5!3m4!1s0x0:0xa70b6b06f9e1682f!8m2!3d46.059731!4d14.498712
Tuesday 18 October
- Mon 17 Oct
- Tue 18 Oct
- 09:30 → 10:50
  Results from recent TCT measurements on different detector structures Main Lecture Hall
  
  Main Lecture Hall
  
  Jožef Stefan Institute
  
  Jamova 39 SI-1000 Ljubljana
  - 09:30
    
    Edge-TCT measurements 20m
    
    Speaker: Finn Feindt (University of Hamburg)
    
    2ndTCT_WS-Feindt4.pdf
  - 09:50
    
    TCT measurements on 3D detectors 20m
    
    Speaker: Lluis Simon
    
    TCT_workshop_2_lsimon_talk.pdf
  - 10:10
    
    TCT measurements on diodes 20m
    
    Speaker: William Holmkvist (C)
    
    TCTworkshopPres.pdf
  - 10:30
    
    Temperature dependance of LGAD response 20m
    
    Speaker: Roberto Mulargia (Universita e INFN Torino (IT))
    
    talk_TCTLjubljana2016.pdf
- 10:50 → 11:10
  
  Coffee break 20m Main Lecture Hall
  
  Main Lecture Hall
  
  Jožef Stefan Institute
  
  Jamova 39 SI-1000 Ljubljana
- 11:10 → 12:20
  Simulations Main Lecture Hall
  
  Main Lecture Hall
  
  Jožef Stefan Institute
  
  Jamova 39 SI-1000 Ljubljana
  - 11:10
    
    Comparison of different signal simulation tools 20m
    
    Speaker: Gregor Kramberger (Jozef Stefan Institute (SI))
    
    ComparissonOfSimulators_2ndTCT.pdf
    
    ComparissonOfSimulators_2ndTCT.pptx
  - 11:30
    
    TCAD simulations 20m
    
    Speaker: Marco Bomben (Centre National de la Recherche Scientifique (FR))
    
    bomben_tcad_161020.ppt
  - 11:50
    
    Update on TRACS 10m
    
    Speaker: Marcos Fernandez Garcia (Universidad de Cantabria (ES))
    
    MarcosFernandez_TRACS-2ndTCTWorkshop.pdf
  - 12:00
    
    Update on KDetSim 10m
    
    Speaker: Gregor Kramberger (Jozef Stefan Institute (SI))
    
    Discussion.pdf
    
    Discussion.pptx
    
    UpdateOnKDetSim.pdf
    
    UpdateOnKDetSim.pptx
- 12:20 → 13:05
  
  Discussion on Common Analysis, DAQ… Main Lecture Hall
  
  Main Lecture Hall
  
  Jožef Stefan Institute
  
  Jamova 39 SI-1000 Ljubljana
- 13:05 → 14:05
  
  Hands on experience: individual tests/trials/exercises JSI Labs
  
  JSI Labs
  
  Visiting the labs.

2nd TCT Workshop

Main Lecture Hall

Jožef Stefan Institute

Main Lecture Hall

Jožef Stefan Institute

Main Lecture Hall

Jožef Stefan Institute

Main Lecture Hall

Jožef Stefan Institute

Main Lecture Hall

Jožef Stefan Institute

Main Lecture Hall

Jožef Stefan Institute

Main Lecture Hall

Jožef Stefan Institute

Za pumpo

JSI Labs

Main Lecture Hall

Jožef Stefan Institute

Main Lecture Hall

Jožef Stefan Institute

Pivnica Union -- Pivovarniška ulica 2, 1000 Ljubljana

Main Lecture Hall

Jožef Stefan Institute

Main Lecture Hall

Jožef Stefan Institute

Main Lecture Hall

Jožef Stefan Institute

Main Lecture Hall

Jožef Stefan Institute

JSI Labs