6-22 November 2017
CERN
Europe/Zurich timezone

High-energy electrons detection in transmission electron microscopy

7 Nov 2017, 11:10
55m
IdeaSquare (CERN)

IdeaSquare

CERN

Description

Speaker: L. Mele (Thermo-Fisher)

Silicon-based pixelated detector are gaining more and more popularity in electron microscopy and their development is boosting the fast growth of this market. Here an introduction to the basic interaction mechanisms of electrons in the energy range 80-300 keV with silicon-based pixelated detectors is given along with a description of the main acquisition techniques in transmission electron microscopy.

Presentation Materials