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Description
Focused Ion Beam Analysis at CERN, recent advances in accelerator technology have required improved insights into the interaction between the nano and microscale structure, processing route and properties in order to improve performance and optimise design.
In order to provide answers to these complex questions and in anticipation of this arising need, in May 2016 the EN-MME group at CERN acquired a Zeiss XB540 Focused Ion Beam (FIB) -Scanning Electron Microscope with support from other departments and the Accelerator Consolidation project. FIB analysis is a powerful and versatile approach that can be used to perform nanoscale imaging, sub-surface characterisation, 3D microscale structural assessment and microscale mechanical quantification, amongst many other techniques.
This presentation provides an overview of the capabilities of the FIB system, as well as synopsis of the activity and some typical results. Examples of ongoing technique development, which has been implemented to meet emerging questions from different projects, will also be presented.
ATS Seminars Organisers: H. Burkhardt (BE), M. Modena (ATS), T. Stora (EN)
Coffee / tea will be served after the seminar in room 30/7-012 next to the Auditorium
