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Dielectric measurement techniques, details of SiC results

Name: Dielectric measurement techniques, details of SiC results
Start: 2010-01-13T14:00:00+01:00
End: 2010-01-13T16:00:00+01:00
Location: CERN

Wednesday 13 Jan 2010, 14:00 → 16:00 Europe/Zurich

6/2-004 (CERN)

6/2-004

CERN

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Walter WUENSCH (CERN)

- 1
  
  Dielectric measurement techniques, details of SiC results
  
  Speaker: Tatiana Pieloni (Universita degli Studi di Milano)
  
  Slides