RD53 regulator reliability and CMOS technology robustness

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    • 1
      Problem Description
      Speaker: Michael Karagounis (Hochschule Hamm-Lippstadt)
    • 2
      Methodology for Risk Minimization and Assessment
      Speaker: Dr Lange Andre (Fraunhofer Dresden)
    • 3
      Discussion "Course of Action"
      Speaker: Michael Karagounis (Hochschule Hamm-Lippstadt)