18th International School on the Effects of Radiation on Embedded Systems for Space Applications (SERESSA)

Speaker List

• Ygor Aguiar (CERN)
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    School Closure

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    School Opening

• Otmane Ait Mohamed (Concordia University)
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    Single Event Multiple Transient Analysis of Digital Circuits using Satisfiability Modulo Theories

• Ricardo Augusto da Luz Reis (UFRGS)
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    Mitigation of Soft Errors at Circuit Level

• Hugh Barnaby (ASU)
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    Modeling Cumulative Radiation Effects in Semiconductor Devices and Integrated Circuits

• Melanie Berg (AS&D in support of NASA)
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    The Value of “Test-As-You-Fly”: Modernizing FPGA Experimentation And Data Analysis for Critical Space Missions

• Stefano Bonaldo (University of Padova)
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    TID Mechanisms in Nanometer-Scale Microelectronic Technologies

• Stephen Buchner (Naval Research Laboratory)
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    Fundamental Mechanisms of Non-Destructive SEEs in Devices and Circuits

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    Fundamentals of the Pulsed-Laser Technique for Single-Event Effects Testing

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    Radiation Hardness Assurance (RHA)

• Jan Budroweit
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    System-Level Design and Radiation Test Methodologies based on a novel Software-Defined Radio Architecture for Space Applications

• Stephan Busch (Telematik Zentrum)
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    Radiation Hardening by Software: Advanced FDIR and Redundancy Concepts with COTS in Space

• Matteo Cecchetto (CERN)
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    Accelerator Radiation Environment and Neutron Effects in Electronics

• Juan Antonio Clemente (Universidad Complutense de Madrid (UCM))
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    Analyzing data extracted from radiation tests in advanced SRAMs

• Léo Coïc (TRAD)
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    Introduction to OMERE: a tool for space environment and radiation effects on electronics devices I

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    Introduction to OMERE: a tool for space environment and radiation effects on electronics devices II

• Andrea Coronetti (CERN - University of Montpellier (FR))
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    The RADNEXT irradiation facility network

• Alessandra Costantino
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    The challenges of testing COTs devices at European Irradiation Facilities

• Matteo Ferrari (CERN)
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    Introduction to ‘Radiation to Materials’: methodologies and examples

• Pascal Fouillet
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    Fundamentals of the Pulsed-Laser Technique for Single-Event Effects Testing

• Ruben Garcia Alia (CERN)
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    CELESTA project

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    School Opening

• Fakhreddine Ghaffari (CY Cergy Paris University)
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    Sensitivity characterization of SRAM-based FPGA against SEU and SET

• Joel Hales (Naval Research Laboratory)
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    Fundamentals of the Pulsed-Laser Technique for Single-Event Effects Testing

• Nicolaus Hanowski (ESA)
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    Earth Observation Mission Scenarios and their Implications for Satellite Radiation Resilience

• Adrian Ildefonso (Georgia Institute of Technology)
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    Fundamentals of the Pulsed-Laser Technique for Single-Event Effects Testing

• Ani Khachatrian (US Naval Research Laboratory)
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    Fundamentals of the Pulsed-Laser Technique for Single-Event Effects Testing

• Daniel Loveless (University of Tennessee Chattanooga)
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    Radiation Mitigation Techniques for Mixed-Signal Circuits

• David Lucsanyi (CERN)
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    Introduction to G4SEE: a toolkit for simulating radiation effects in electronics I

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    Introduction to G4SEE: a toolkit for simulating radiation effects in electronics II

• Markus Markgraf (DLR)
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    The Phoenix GPS Receiver for Rocket and Satellite Applications: An Example for the Successful Utilization of COTS Technology in Space Projects

• Dale McMorrow (Naval Research Laboratory)
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    Fundamentals of the Pulsed-Laser Technique for Single-Event Effects Testing

• Jonathan Allen Pellish
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    Single-Event Effect Criticality Analysis

• Michel Pignol (CNES)
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    System hardening and real space applications

• Vincent Pouget
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    Fundamentals of the Pulsed-Laser Technique for Single-Event Effects Testing

• Anthony Sanders
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    Single-Event Effect Criticality Analysis

• Klaus Schilling (Telematik Zentrum)
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    Radiation Hardening by Software: Advanced FDIR and Redundancy Concepts with COTS in Space

• Raffaello Secondo (CERN)
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    CELESTA project

• Hans-Juergen Sedlmayr (DLR)
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    COTS in (Deep) Space

• Luca Sterpone
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    SEE effects on VLSI devices: challenges and solutions

• Raoul Velazco (TIMA)
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    Error rate prediction for programmable circuits: methodology, tools and studied cases

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    School Closure

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    School Opening

• Frédéric Wrobel
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    Modelling and prediction of Single Event Transient and Single Event Upset

• Alessandro Zimmaro (Universite Montpellier I (FR))
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    CELESTA project