Speaker
Paul Leroux
(KU Leuven (BE))
Description
We will present the objectives and recent results from the joint research activities within the EU INFRAIA project RADNEXT. This includes recent results on radiation monitors, dosimeters and beam characterization, on the standardization of system level radiation qualification methodology, on cumulative total ionizing dose and displacement damage effects in electronics and finally on tools and approaches for modelling radiation effects in electronics.
