ESD and SEY of technical surfaces at cryogenic temperature // RF impedance measurement of a-C/Ti and NEG films // Impedance mesurement on beam screens

Name: ESD and SEY of technical surfaces at cryogenic temperature // RF impedance measurement of a-C/Ti and NEG films // Impedance mesurement on beam screens
Start: 2022-04-05T10:30:00+02:00
End: 2022-04-05T12:00:00+02:00
Location: CERN

Tuesday 5 Apr 2022, 10:30 → 12:00 Europe/Zurich

ZOOM (CERN)

ZOOM

CERN

Michal Haubner (Czech Technical University in Prague (CZ)), Patrick Krkotic, Kristof Brunner (Eotvos Lorand University (HU))

Organisor

guillaume.rosaz@cern.ch

- 10:30 → 11:00
  
  ESD and SEY of technical surfaces at cryogenic temperature 30m
  
  Speaker: Michal Haubner (Czech Technical University in Prague (CZ))
  
  VSC seminar 2022 Haubner, v25.pdf
- 11:00 → 11:30
  
  RF impedance measurement of a-C/Ti and NEG films 30m
  
  Speaker: Patrick Krkotic
  
  VSCSeminar22_PK.pdf
  
  VSCSeminar22_PK.pptx
- 11:30 → 11:45
  
  Impedance mesurement on beam screens 15m
  
  Speaker: Kristof Brunner (Eotvos Lorand University (HU))
  
  k_brunner_group_seminar_05_04_2022.pdf
  
  k_brunner_group_seminar_05_04_2022.pptx

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ESD and SEY of technical surfaces at cryogenic temperature // RF impedance measurement of a-C/Ti and NEG films // Impedance mesurement on beam screens

ZOOM

CERN