13 December 2022
Europe/Zurich timezone

A Guide to Japan for SEE Travelers

After years of global pandemic, many countries have started opening their doors to foreigners - of course Japan as well. This country has a small land area but has various accelerators that can cover from terrestrial muons to galactic heavy-ions. In this webinar, after a quick overview of the accelerator facilities available for SEE testing in Japan, two Japanese professionals will share with you the latest status of selected facilities together with the highlights of exciting results from their experiments.


Part I: Galactic Cosmic-Ray SEE testing

Japan has many accelerator facilities, but only a few beam lines are available for the high LET Galactic Cosmic-Ray testing for SEE. Takasaki Ion Accelerator for Advanced Radiation Application (TIARA) has some specialized beam lines for SEE testing. Broad beam irradiation lines from a K=110 MeV AVF cyclotron and a micro-beam line from a 3-MV tandem accelerator are available for the testing and used for a long time in Japan as leading facilities. Specifications of the beam lines and their target chambers as well as some results from experiments on the beam lines will be given in the talk. In addition, application of high energy ions from the synchrotron that can penetrate completely thick devices such as power MOSFETs will be shown.

 

A TIARA target chamber for heavy ion SEE testing

Facilities to be covered

  • TIARA AVF Cyclotron (100-MeV heavy ions)
  • TIARA Tandem accelerator (10-MeV but focused heavy ions)
  • HIMAC Synchrotron (GeV heavy ions)

Research to be covered

  • SEEs in power devices
  • SEEs in LSIs

 

Speaker:

 

Dr. Takahiro Makino (QST)

Takahiro Makino received the Ph.D. degree in space and astronautical science from the Graduate University for Advanced Studies, Hayama, Japan, in 2009. After receiving the Ph.D. degree, he joined the Japan Atomic Energy Agency (now QST), Chiba, Japan, in 2009. He is currently a Principal Researcher with the Department of Advanced Functional Materials Research, Takasaki Advanced Radiation Research Institute, National Institutes for Quantum Science and Technology (QST), Chiba.

 

His research interests are radiation effects on semiconductor devices. He studies radiation-induced failures (displacement damage, total ionizing dose, and single event effects) for applications used in radiation environments and radiation detection by using semiconductor devices. Dr. Makino was a recipient of the RADECS 2018 Best Conference Paper Award.

 


Part II: Terrestrial Cosmic-Ray SEE testing

This talk introduces the characterization of soft error rate in terrestrial environment. Cosmic-ray air showers produce neutrons and muons as secondary particles in the atmosphere. Traditionally, high-energy neutrons are thought to be a dominant source of soft errors in the terrestrial environment, and neutron white beams that reproduce the energy spectra on the ground are used for accelerated SEE testing. Meanwhile, it was recently revealed that muons can induce bit upsets in advanced SRAM memories. This talk discusses SEE testing for neutron- and muon-induced SEUs with emphasis on the facilities used in our work. 

Facilities to be covered

  • Osaka-U RCNP (white neutron) 
  • J-PARC MUSE (muon)

Research to be covered

  • SEEs in memories

 

Osaka-U RCNP for white neutron SEE testing

 

J-PARC MUSE for muon SEE testing

 

Speaker:

Prof. Masanori Hashimoto (Kyoto University)

Masanori Hashimoto received the Ph.D. degree from Kyoto University in 2001. He is currently a Professor with the Graduate School of Informatics, Kyoto University. His current research interests include design for reliability, timing and power integrity analysis, reconfigurable computing, soft error characterization, and low-power circuit design.

 

Registration for the seminar is now open. 

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