Speaker
Pablo Martinez Ruiz Del Arbol
(Universidad de Cantabria and CSIC (ES))
Description
This work presents several uses of machine learning techniques, ranging from regressional neural networks, convolutional neural networks and generative adversarial neural networks, applied to scattering muography in the context of industrial problems and applications. A review of the different techniques will be given together with some propects on future developments being carried out. A discussion on the advantages and drawbacks of these techniques will also be provided.
Author
Pablo Martinez Ruiz Del Arbol
(Universidad de Cantabria and CSIC (ES))
