Speaker
Milos Manojlovic
(Consejo Superior de Investigaciones Cientificas (CSIC) (ES))
Description
This presentation aims to provide an update on the recently completed AC-LGAD run at CNM. We begin by showing the electrical characterization of the produced wafers by IV and CV measurements. Several devices with different pad configurations and sizes were subjected to extensive TCT measurements. The TCT measurements reveal that the signal weakens as the laser is moved further away from the AC pad. We demonstrate the linear attenuation behavior of the signal loss between adjacent pads.
Primary authors
Dr
Giulio Pellegrini
(Centro Nacional de Microelectrónica (IMB-CNM-CSIC) (ES))
Ivan Lopez Paz
(The Barcelona Institute of Science and Technology (BIST) (ES))
Mr
Jairo Antonio Villegas Dominguez
(Consejo Superior de Investigaciones Cientificas (CSIC) (ES))
Milos Manojlovic
(Consejo Superior de Investigaciones Cientificas (CSIC) (ES))
Neil Moffat
(Consejo Superior de Investigaciones Cientificas (CSIC) (ES))
Dr
Salvador Hidalgo
(Instituto de Microelectronica de Barcelona (IMB-CNM-CSIC))
