Present: Marlene Turner, Patric Muggli, Giovanni Zella Della Porta, Edda Gschwendtner, Nikita Zena van Gils, Fern Pannell, Collette Pakuza, Vittorio Bencini, Arthur Clairembaud
Discussion:
Motivation to measure electron bunch length and jitter
- Sanity check
- how often measurement is necessary depends on parameter sensitivity. If very sensitive (e.g. to RF phase or bunch charge), this check should be done daily. If not, once before the run may be sufficient.
How the measurements were done (GP):
- Electron beam optics is set to focus on BTV 350 and use high charge (~750 pC)
- beam typically then seen on basler camera (located next to the streak camera (SC))
- there should be already a bit of light on the streak camera that can be optimized by beam steering using correctors 47 and 49
- ideally one maps the location of the slit on the basler camera
- then close the streak camera slit and the add the bandpass filter (beam has been visible in 2022 with filter and 20 um slit) using the current configuration of the line
Measurements in preparation for the 2024 Run:
- Bunch length as a function of charge
- Bunch length as a function of RF phase by ~pm 15 degrees (and other parameters)
- Timing jitter (this requires also the very very low power laser on the streak camera and ideally an IR bandpass filter)
To prepare for the measurements:
- Turn on the streak camera, To do: AC and PM after consulting with Jan Puzek.
- Learn how to move the streak camera line mirror (to image upstream, not downstream light)
- Realign or at least check the line optical alignment using the HeNe, To do: AC, PM, MT
- Perform the measurements, To do: NG, GP
- Data analysis: to be decided, simple online analysis is available
Side notes:
- the streak camera setup in its current version has measured the e-bunch (single bunches) in 2022
- there may have been some confusion as several alignment attempts had failed because the streak camera was broken
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