DC electrical breakdown test setup with in-situ mechanical pulse stress

Not scheduled
20m

Speaker

Dr Yasuo Higashi (KEK)

Description

We designed and constructed a test system to investigate the high electric field discharge characteristics due to the change in surface properties caused by in-situ mechanical pulse stress. Mechanical pulse stress was applied only near the center of the cathode surface by PIEZO actuator. In this presentation, we report on the status and results of the system characteristics and a DC breakdown test.

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Author

Dr Yasuo Higashi (KEK)

Co-authors

Dr Bruno Spataro (INFN) Dr Daisuke Sato (AIST) Dr Dogashev Valery (SLAC) Dr Luigi Faillace (INFN) Prof. Mitsuo Akemoto (KEK) Prof. Shuji Matsumoto (KEK) Prof. Tetsuo Abe (KEK) Prof. Tohiyasu Higo (KEK)

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