Speaker
Description
This contribution presents the design strategy and the preliminary characterization of the first, proof-of-concept, production of DC-coupled Resistive Silicon Detector (DC-RSD). The DC-RSD is a resistive thin LGAD with a DC-coupled read-out. This design leads to signal containment within a predetermined number of electrodes using isolating trenches (TI technology).
Several test structures and application-oriented devices have been implemented in the wafer layout.
The sensors, produced at FBK in the framework of the 4DSHARE project, have been characterized on wafer @FBK. A small subset of devices have been tested also with a laser TCT system, to study signal properties and signal sharing in the DC-RSD.
This preliminary studies will provide us with very useful feedback on the soundness of the DC-RSD concepts.
| Type of presentation (in-person/online) | in-person presentation |
|---|---|
| Type of presentation (I. scientific results or II. project proposal) | I. Presentation on scientific results |
