Beam test and digitization of TaichuPix-3 silicon pixel detector for the CEPC vertex detector

4 Feb 2025, 16:17
1m
Sala Stringa (FBK, Trento)

Sala Stringa

FBK, Trento

Via Sommarive 18 38123 Povo di Trento ITALY
Poster CMOS MAPS Poster Session

Speaker

Hancen Lu

Description

The TaichuPix series chips, as sensors designed for the CEPC vertex detector, do not have a complete digital model, resulting in lower accuracy in simulations, especially in the long barrel's forward region. Allpix-Square, as an open-source software, is able to simulate the physical process of silicon pixel detectors and digitization of the front-end electronics. With the beam test results with different incident angles at BRSF we conducted, and the AllPix-Squared simulation, we will be able to achieve high-precision digitization for the TaichuPix-3 chip. This report will show the comparison between simulation and beam test results in cluster size and efficieny variation with the incident angle and threshold.

Authors

Hancen Lu Tianyuan Zhang (中国科学院高能物理研究所)

Co-author

Zhijun Liang (Chinese Academy of Sciences (CN))

Presentation materials