Characterization of silicon Monolithic Stitched Sensors for the ALICE ITS3

5 Feb 2025, 11:45
15m
Sala Stringa (FBK, Trento)

Sala Stringa

FBK, Trento

Via Sommarive 18 38123 Povo di Trento ITALY
Oral CMOS MAPS CMOS MAPS

Speaker

Ivan Ravasenga (CERN)

Description

The ALICE Collaboration at the Large Hadron Collider (LHC) will replace the three innermost layers of the Inner Tracking System (ITS) during the Long Shutdown 3 in 2026-2029. The new inner tracker, called ITS3, will consist of truly-cylindrical silicon barrels to improve the pointing resolution by a factor of two over a large momentum range and the tracking efficiency at very low transverse momenta ($p_{\rm T}$ < 0.3 GeV/$c$).
The first three layers will be equipped with stitched 27 cm long wafer-scale monolithic active pixel sensors built using a 65 nm CMOS imaging process technology. The sensors will be thinned to 50 $\mu$m to become flexible allowing the formation of truly-cylindrical barrels with an extremely low material budget of 0.09 % X/X$_{0}$ per layer. Starting from mid-2023, chip prototypes, the so-called MOnolithic Stitched Sensors (MOSS), have been produced to demonstrate the feasibility of the stitching process. A single chip has a dimension of 14 mm $\times$ 259 mm and a total of 6.7 million pixels organized in 10 repeated sensor units with pixel pitches of 18 and 22.5 $\mu$m. A second design is implemented in the MOnolithic Stitched Sensor with Timing (MOST) to evaluate on-chip powering segmentation containing 0.9 million pixels with 18 $\mu$m pitch distributed on a smaller area of 2.5 mm $\times$ 259 mm.
The primary goal of MOSS and MOST is to learn about the stitching technique implementation, yield and performance of wafer-scale sensors in view of the production of the ITS3 final-size full-functionality prototype sensor chip foreseen for summer 2025. The characterization campaign of the stitched sensors includes the verification of power domain impedances, DAC performance, pixel front-end readout response, threshold scans and fake-hit rate scans. This presentation will focus on the results and learnings from the characterisation campaign of the stitched sensors in the laboratory and in the test-beam facilities with an overview of the final chip features.

Author

Presentation materials