Name: RAWG Meeting: Equipment Life Testing and Reliability Analysis for Electronics
Start: 2025-01-23T09:00:00+01:00
End: 2025-01-23T10:00:00+01:00
Location: CERN

RAWG Meeting: Equipment Life Testing and Reliability Analysis for Electronics

Thursday 23 January 2025 - 09:00
CERN (774/1-079)

: Sessions

: Talks

: Breaks

23 Jan 2025

09:00	Cryogenics CHARM radiation campaign results and IC life testing - Nikolaos Chatzipapas (CERN) (774/1-079) Cryogenics CHARM radiation campaign results and IC life testing.pdf Cryogenics CHARM radiation campaign results and IC life testing.pptx
09:20	Reliability Testing Infrastructure at CERN: An Overview of the QART Lab - Abhishek Sharma (CERN) (774/1-079) ASharma_RAWG_Seminar_2025_01_23.pdf
09:50	Discussion (774/1-079)

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