RAWG Meeting: Equipment Life Testing and Reliability Analysis for Electronics

Name: RAWG Meeting: Equipment Life Testing and Reliability Analysis for Electronics
Start: 2025-01-23T09:00:00+01:00
End: 2025-01-23T10:00:00+01:00
Location: CERN

Thursday 23 Jan 2025, 09:00 → 10:00 Europe/Zurich

774/1-079 (CERN)

774/1-079

CERN

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- 1
  
  Cryogenics CHARM radiation campaign results and IC life testing
  
  Speaker: Nikolaos Chatzipapas (CERN)
  
  Cryogenics CHARM radiation campaign results and IC life testing.pdf
  
  Cryogenics CHARM radiation campaign results and IC life testing.pptx
- 2
  
  Reliability Testing Infrastructure at CERN: An Overview of the QART Lab
  
  Speaker: Abhishek Sharma (CERN)
  
  ASharma_RAWG_Seminar_2025_01_23.pdf
- 3
  
  Discussion

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RAWG Meeting: Equipment Life Testing and Reliability Analysis for Electronics

774/1-079

CERN