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In order to develop new methods for determining the emittance of relativistic electron beams, that is, its transverse dimensions and the characteristic beam divergence angle in both planes based on the results of measurements of the angular distributions of diffracted transition radiation (DTR) [1,2] the study of the influence of the angular profile of the reflectivity of crystal planes on the recorded angular distribution of the DTR was continued. It is shown that the difference between the X-ray reflectivity profile and the δ-function leads to a difference in the angular distributions of TR and DTR, which is expressed in a decrease in the depth of the dip in the center of the angular distribution and a decrease in the amplitude at the maximum of DTR, simulating the contribution of additional divergence of the particle beam [3]. It is shown that the contribution of the discussed effect is higher for Laue geometry than for Bragg one. The degree of influence of this difference decreases with increasing energy of the detected photons and depends on the divergence of the electron beam [4] and does not allow using the technique [1,2] for electron energies above 40-50 GeV.
References
- S.V. Blazhevich et al. // Phys. Lett. A, 2020, V. 384, 126321.
- Yu.A. Goponov et al. // NIM A, 2021, V. 996, 165132.
- A.V. Berdnichenko et al. // NIM B, 2023, V. 545, 165137.
- A.V. Berdnichenko et al. // JINST, 2024, V. 19, C05043