2–6 Feb 2026
TIFR, Mumbai
Asia/Kolkata timezone

The new NA60+/DiCE experiment at the CERN SPS with wafer-scale, stitched, monolithic active pixel sensors

2 Feb 2026, 15:30
15m
TIFR, Mumbai

TIFR, Mumbai

Tata Institute of Fundamental Research, Homi Bhabha Road, Navy Nagar, Colaba, Mumbai 400005, India
Oral Solid state detectors Parallel Session-II

Speaker

Dr SIDDHANTA, Sabyasachi (INFN, Italy and CERN, Switzerland)

Description

NA60+/DiCE is a new fixed-target experiment designed to study the phase diagram of the strongly interacting matter at high baryochemical potential from 200 to 550 MeV at the CERN SPS. The experimental setup includes a vertex spectrometer based on large-area stitched Monolithic Active Pixel Sensors (MAPS), a muon spectrometer based on Multi Wire Proportional Chambers, two dipole magnets, a two-stage absorber system and a target system. This contribution focuses on the experimental apparatus and the detector developments - in particular the wafer-scale stitched MAPS based on 65nm CMOS imaging process. The fabrication of the first full scale stitched MAPS called the MOSAIX is underway. The contribution will also touch upon the qualification and implementation plan of these sensors in NA60+/DiCE.

Position Researcher
Affiliation INFN, Italy and CERN, Switzerland
Country Italy, Switzerland

Author

Dr SIDDHANTA, Sabyasachi (INFN, Italy and CERN, Switzerland)

Presentation materials