2–6 Feb 2026
TIFR, Mumbai
Asia/Kolkata timezone

Characterization of Radiation Effects on CMOS Depleted Monolithic Active Pixel Sensors

Not scheduled
2m
TIFR, Mumbai

TIFR, Mumbai

Tata Institute of Fundamental Research, Homi Bhabha Road, Navy Nagar, Colaba, Mumbai 400005, India
Poster Solid state detectors Poster session

Speaker

Prof. BEHERA, Prafulla (Indian Institute of Technology Madras (IN))

Description

Future collider experiments demand pixel detectors that can withstand extreme radiation environments while maintaining reliable performance at high luminosities. To address these requirements, a CMOS depleted monolithic active pixel sensor has been designed with an advanced readout scheme, enabling strong radiation tolerance, high hit-rate capability, fine spatial granularity, and accurate timing. Prior to deployment in a detector, comprehensive characterization is essential to validate its performance. In this study, the sensor was subjected to irradiation using a high-intensity X-ray source, and its operational behavior under these conditions was evaluated. The presentation reports the most recent measurement results obtained from these investigations.

Position Professor
Affiliation IIT Madras
Country India

Authors

Prof. BEHERA, Prafulla (Indian Institute of Technology Madras (IN)) CHEMBAKAN, Theertha (Indian Institute of Technology Madras (IN)) DASH, Ganapati (Indian Institute of Technology Madras (IN)) VIJAY, Anusree (Indian Institute of Technology Madras (IN))

Presentation materials

There are no materials yet.