10–14 Nov 2025
CERN
Europe/Zurich timezone

Development of 3D Pixel Sensors via an 8-inch CMOS-Compatible Process

11 Nov 2025, 10:35
16m
6/2-024 - BE Auditorium Meyrin (CERN)

6/2-024 - BE Auditorium Meyrin

CERN

114
Show room on map
WG2 - Hybrid silicon sensors WG2 - Hybrid silicon technologies

Speaker

Huimin Ji (Institute of Microelectronics, Chinese Academy of Sciences)

Description

In the construction of High-Luminosity Large Hadron Collider (HL-LHC) and Future Circular Collider (FCC) experiments, 3D pixel sensors have become indispensable components due to their superior radiation hardness, fast response, and low power consumption. However, there are still significant challenges in the process of 3D sensors manufacturing. In this work, single devices and arrays of 3D sensors based on 30 $\mu$m epitaxial silicon wafer have been designed, simulated, fabricated, and tested. This process was developed on the 8-inch CMOS process platform of the Institute of Microelectronics of the Chinese Academy of Sciences (IMECAS). The key processes include Deep Reactive Ion Etching (DRIE) with the Bosch process, in-situ doping, and an innovative back-etching. After testing the 3D pixel sensors, we have summarized the leakage current and capacitance of devices with different sizes with respect to bias voltages. We also found that the fabricated devices were almost all successfully produced, which laid a strong foundation for subsequent large-scale mass production.

Type of presentation (in-person/online) online presentation (zoom)
Type of presentation (I. scientific results or II. project proposal) I. Presentation on scientific results

Authors

Huimin Ji (Institute of Microelectronics, Chinese Academy of Sciences) Prof. Manwen Liu (Institute of Microelectronics, Chinese Academy of Sciences) Prof. Zhihua Li (Institute of Microelectronics, Chinese Academy of Sciences)

Presentation materials