10–14 Nov 2025
CERN
Europe/Zurich timezone

Gain supression studies on IMB-CNM LGAD detectors

12 Nov 2025, 09:00
16m
6/2-024 - BE Auditorium Meyrin (CERN)

6/2-024 - BE Auditorium Meyrin

CERN

114
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WG2 - Hybrid silicon sensors Joint WG2-WG3

Speaker

Jairo Antonio Villegas Dominguez (Consejo Superior de Investigaciones Cientificas (CSIC) (ES))

Description

Low Gain Avalanche Detectors (LGADs) have recently emerged as key sensors for precise timing measurements, enabling accurate tracking of charged particles and photons in High Energy Physics (HEP) experiments and beyond. The time resolution is closely linked to the detector's gain, with a direct correlation between gain stability and timing precision. In turn, the gain of LGADs depends on the nature of the particle being detected, since both the ionization density and the depth at which the charge is generated within the active volume influence the multiplication process, a phenomenon known as gain suppression. This contribution presents gain suppression studies performed on LGAD detectors fabricated at IMB-CNM, employing Ion Beam Induced Current (IBIC) measurements with a focused 2.3 MeV proton microbeam at different incidence angles. The analysis provides direct insight into the spatial dependence of charge multiplication and highlights the sensitivity of LGAD performance to different ionization density profiles.

Type of presentation (in-person/online) online presentation (zoom)
Type of presentation (I. scientific results or II. project proposal) I. Presentation on scientific results

Author

Jairo Antonio Villegas Dominguez (Consejo Superior de Investigaciones Cientificas (CSIC) (ES))

Co-authors

Ms Carmen Torres (Centro Nacional de Aceleradores (CNA)) FRANCISCO JAVIER GARCIA LOPEZ Mr Florent Dougados (Instituto de Microelectrónica de Barcelona (IMB-CNM)) Dr Maria Del Carmen Jimenez Ramos (Universidad de Sevilla (ES)) Mr Mauricio Rodriguez-Ramos (Centro Nacional de Aceleradores (CNA)) Pablo Fernandez-Martinez (IMB-CNM, CSIC) Dr Salvador Hidalgo (Instituto de Microelectronica de Barcelona (IMB-CNM-CSIC))

Presentation materials